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_aAbran, Alain, _d1949-. _eautor |
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_aSoftware metrics and software metrology / _cAlain Abran |
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_aHoboken, New Jersey : _bWiley ; _aLos Alamitos, California : _bIEEE Computer Society, _c[2010] |
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| 264 | 4 | _c©2010 | |
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_axix, 328 páginas : _bilustraciones |
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_aMedición de software _xDiseño |
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_aMedición de software _xDiseño _vEstudio de casos |
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| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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