| 000 | 00961nam a2200277zi 4500 | ||
|---|---|---|---|
| 005 | 20220224111700.0 | ||
| 008 | 170830s2017 xxua 000 0 eng | ||
| 020 | _a9781498743808 | ||
| 035 | _aMX001001956853 | ||
| 040 |
_aDLC _bspa _erda _cDLC _dDLC _dUNAMX |
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_aTK7871.85 _bS4535 |
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_a621.3815/2 _223 |
| 245 | 0 | 0 |
_aSemiconductor devices in harsh conditions / _cedited by Kirsten Weide-Zaage and Malgorzata Chrzanowska-Jeske |
| 264 | 1 |
_aBoca Raton : _bCRC Press Taylor & Francis, Group, _c[2017] |
|
| 264 | 4 | _c©2017 | |
| 300 |
_axxii, 234 páginas : _bilustraciones |
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| 490 | 0 | _aDevices, circuits, and systems | |
| 650 | 0 |
_aSemiconductores _xConfiabilidad |
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| 650 | 0 | _aAmbientes extremos | |
| 650 | 0 | _aPruebas ambientales | |
| 700 | 1 |
_aWeide-Zaage, Kirsten, _eeditor |
|
| 700 | 1 |
_aChrzanowska-Jeske, Malgorzata, _eeditor |
|
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 999 |
_c10531 _d10531 |
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