| 000 | 00975nam a2200253zi 4500 | ||
|---|---|---|---|
| 005 | 20220224111637.0 | ||
| 008 | 140320s2014 xxu 000 0 eng | ||
| 020 | _a9781439829417 (encuadernado en tela : pápel alcalino) | ||
| 035 | _aMX001001645515 | ||
| 040 |
_aDLC _bspa _beng _cDLC _erda _dDLC _dUNAMX |
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| 050 | 0 | 0 |
_aTK7871.99M44 _bT47 |
| 082 | 0 | 0 |
_a621.39/732 _223 |
| 245 | 0 | 0 |
_aTesting for small-delay defects in nanoscale CMOS integrated circuits / _ceditors, Sandeep K. Goel, Krishnendu Chakrabarty |
| 264 | 1 |
_aBoca Raton : _bCRC Press, _c2014 |
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| 300 | _axv, 247 páginas | ||
| 490 | 0 | _aDevices, circuits, and systems | |
| 650 | 0 |
_aSemiconductores complementarios de óxido metálico _xPruebas |
|
| 700 | 1 |
_aGoel, Sandeep K., _eeditor de la compilación |
|
| 700 | 1 |
_aChakrabarty, Krishnendu, _eeditor de la compilación |
|
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c9135 _d9135 |
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